Patent · US Expired

Interferometer system of compact configuration

US6882433B2 · kind B2 · utility

6Cited by
18References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 2003
Grant dateApr 19, 2005
Priority date
Expiry dateJun 30, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B9/02054
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An expanding measuring beam is inserted into a cavity of a frequency-scanning interferometer. The expanding measuring beam encounters non-specular (diffuse) reference and object surfaces so that the reflected light can be imaged with an imaging system of reduced dimension. The compact interferometer is adaptable to a variety of applications. For example, the compact interferometer can be incorporated into a sensor of a multi-stage measuring instrument or into a handheld imager.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.