Micro connector to facilitate testing of micro electronic component and subassemblies
US6884126B2 · kind B2 · utility
1Cited by
6References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2002 |
| Grant date | Apr 26, 2005 |
| Priority date | — |
| Expiry date | Nov 21, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R2201/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is a testing apparatus which includes a contact connector comprised of a housing with contact blades extending from the housing. The contact blades are pivotally mounted to the housing by pivot rods. A biasing element is coupled to the contact blades, providing resistance against rotary movement of the contact blade in one direction. In one embodiment, the housing has a comb structure including a plurality of slots and slot division walls between the slots. A spacer is disposed in each of the slots, and the contact blades are aligned with the slot division walls.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.