Patent · US Expired

Multichip module, manufacturing method thereof, multichip unit and manufacturing method thereof

US6885099B2 · kind B2 · utility

16Cited by
5References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 22, 2003
Grant dateApr 26, 2005
Priority date
Expiry dateOct 22, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/15192
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Reduction of parasitic capacitance originated between semiconductor chip and optical chip by reducing the connection distance thereof by means of interlayer-connecting the semiconductor chip mounted on a surface of a resin layer and the optical chip buried on another surface of the resin layer with an interlayer via.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.