Device testing
US6885209B2 · kind B2 · utility
23Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2002 |
| Grant date | Apr 26, 2005 |
| Priority date | — |
| Expiry date | Nov 4, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing mode is provided for self testing of the transmitter and receiver pair provided on-chip. The testing mode targets each module individually; wherein when one of the two devices is placed under test, the other is used as a tester. When the transmitter is the device under test and the receiver is the tester that receives a transmitted signal from the transmitter, the receiver is used to determine the data eye size with the transmitted signal. When the receiver is the device under test and the transmitter is the tester, the transmitter is used to determine the amount of noise and power loss tolerated by the receiver.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.