Nanotube cantilever probes for nanoscale magnetic microscopy
US6887365B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 18, 2003 |
| Grant date | May 3, 2005 |
| Priority date | — |
| Expiry date | Sep 18, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/0385
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides an MFM or MRFM analytical device comprising a micro-dimensional probe that is capable of detecting single proton and single electron spin. Furthermore, it provides an MFM or MRFM device comprising a micro-dimensional probe, that is capable of detecting magnetic structures of size of order one nanometer. In particular, the present invention provides a micro-dimensional probe for an MFM or MRFM device that comprises a CNT cantilever that comprises a nanoscale ferromagnetic material. The CNT cantilever can be attached to an electrode as a component of a microscopic probe which is coupled with an electrical circuit as a component of a device for nanoscale MFM or MRFM micro-dimensional probes. The device comprising the probe and electrical circuit can be incorporated into an existing scanning probe microscope (SPM) apparatus having accommodation for electrical readout.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.