Patent · US Expired

Method of forming flash memory with protruded floating gate

US6887756B2 · kind B2 · utility

0Cited by
2References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 3, 2002
Grant dateMay 3, 2005
Priority date
Expiry dateJan 28, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035

Abstract

A method of forming a flash memory with a protruded floating gate. A substrate is provided. An isolation area and a plurality of patterned conductive layers are sequentially formed on the substrate. The isolation area protrudes from the upper surface of the substrate to isolate the patterned conductive layers. A photo resist layer is formed on the patterned conductive layer. The present invention also provides a flash memory with a protruded floating gate comprised a substrate, a plurality of protruded floating gates, an insulator, and a control gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.