Omnidirectional eddy current probes, array probes, and inspection systems
US6888347B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 2003 |
| Grant date | May 3, 2005 |
| Priority date | — |
| Expiry date | Sep 12, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An omnidirectional eddy current probe includes a number of sense coils arranged in a stack having a principal axis. At least two of the sense coils are rotationally skewed about the principal axis relative to one another. The sense coils are operatively connected to each other and a drive coil is also positioned in the stack. An impulse through the drive coil induces a magnetic influx through a conducting material specimen having a surface, thereby generating eddy currents on the surface. Secondary magnetic field generated from the eddy currents produces corresponding signals in the sense coils, and the signals are then analyzed for the possibility of surface flaw in the conducting material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.