Patent · US Expired

Method for measuring polarization dependent loss and insertion loss

US6888624B2 · kind B2 · utility

2Cited by
7References
6Claims
0Family size

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Key dates

Filing dateFeb 8, 2002
Grant dateMay 3, 2005
Priority date
Expiry dateMay 9, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/337
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention provides a method of obtaining accurate measurements of polarization dependent loss and insertion loss during the tests aiming at measuring the polarization properties of optical components. This is achieved by taking into account every polarization disturbance in the line between generation of known states of polarization and the device under test. The method involves computing within a desired range of wavelengths either the transfer matrix of each polarization perturbing element or of all polarization perturbing elements as a whole, and compensating for errors introduced by these polarization perturbing elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.