Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope

US6888674B1 · kind B1 · utility

Assignee

• Leica Microsystems Heidelberg GmbH · DE

Inventors

• Holger Birk · Meckesheim, DE
• Rafael Storz · Heidelberg, DE

Key dates

• Filing date: Jun 15, 2001
• Grant date: May 3, 2005
• Expiry date: Aug 18, 2021

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01S3/1636
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).