Patent · US Expired

Device identification using a memory profile

US6889305B2 · kind B2 · utility

11Cited by
2References
47Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 14, 2003
Grant dateMay 3, 2005
Priority date
Expiry dateNov 15, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/4402
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In accordance with an embodiment of the present invention, a method for identification of a semiconductor device having a plurality of memory blocks, comprises accessing a memory profile for the semiconductor device based at least in part on an identification of defective memory blocks of the semiconductor device and determining a unique identifier for the semiconductor device based at least in part on the memory profile of the semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.