Patent · US Expired

Thermal analysis in a data processing system

US6889908B2 · kind B2 · utility

73Cited by
17References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 2003
Grant dateMay 10, 2005
Priority date
Expiry dateJan 15, 2024

Classification

  • Technology area (CPC F)Mechanical Engineering; Lighting; Heating
  • CPC primaryF24F11/32
  • WIPO fieldThermal processes and apparatus
  • WIPO sectorMechanical engineering

Abstract

Methods, systems, and media for thermal analysis are disclosed. Embodiments of the invention receive temperatures associated with elements of a system. The temperatures received are dependant upon airflow and heating patterns of the elements. Differences between the temperatures received and expected temperatures are detected. Potential airflow and heating patterns associated with a thermal problem are then determined, the potential airflow and heating patterns being substantially consistent with the temperatures received, to identify a root cause of the thermal problem as a probable source of the differences. More specifically, embodiments collect temperature readings from temperature sensors within an enclosure of the system; identify and upward temperature gradient or temperature that exceeds a threshold temperature; and select a failure scenario associated with a root cause of a thermal problem that is similar to the thermal problem described by the temperature readings collected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.