Apparatus and method for inspecting picture elements of an active matrix type display board
US6891532B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 22, 2002 |
| Grant date | May 10, 2005 |
| Priority date | — |
| Expiry date | Feb 19, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2300/08
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a picture element inspecting apparatus and method for an active matrix type display that is constituted by an LCD array device or an EL array device, which is capable of canceling the irregularities in source switches 13, the noise caused by device driving signals, and the irregularities in devices in the measurement apparatus, and enhancing the accuracy of a picture element inspection. The present invention is based on the finding that irregularities in the direction of the source lines 8 can be canceled by performing, in addition to a charging step and first sensing step that are realized by the charging and discharging of picture elements 2, a second sensing step in a state where gate lines are not selected, and subtracting correction picture element data thus obtained, and is characterized in that a subtraction operation is performed on effective picture element data obtained by electrically charging picture elements 2, and correction picture element data obtained in a state where gate lines 9 of picture elements 2 are not selected, and the quality of the picture elements 2 is determined based on the subtraction output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.