Patent · US Expired

Double confocal scanning microscope

US6891670B2 · kind B2 · utility

9Cited by

6References

13Claims

0Family size

Assignee

Leica Microsystems Heidelberg GmbH · DE

Inventors

Hilmar Gugel · Dossenheim, DE
Joerg Bewersdorf · Bar Harbor, US
Stefan W. Hell · Oebisfelde, DE

Key dates

Filing date	Feb 6, 2002
Grant date	May 10, 2005
Priority date	—
Expiry date	Feb 6, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/0076
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.