Selecting multiple settings for an integrated circuit function using a single integrated circuit terminal
US6894501B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 21, 2002 |
| Grant date | May 17, 2005 |
| Priority date | — |
| Expiry date | Sep 3, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage; wherein the functional module implements the one of the settings represented by the control si…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.