Generalized hebbian learning for principal component analysis and automatic target recognition, systems and method
US6894639B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 18, 1991 |
| Grant date | May 17, 2005 |
| Priority date | — |
| Expiry date | Dec 18, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This application discloses a method for distinguishing targets from clutter, comprising the steps inputting data, calculating data statistics from said data and using said data statistics to select target specific feature information to distinguish specific targets from background clutter, generating said target specific feature information from said data statistics, extracting said target specific feature information from said data, using said target specific feature information to distinguish specific targets from background clutter, and outputting target and background clutter information. Classification systems, including hardware and software embodiments, are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.