Patent · US Expired

Method for constructing a photomask assembly using an encoded mark

US6894766B1 · kind B1 · utility

10Cited by
5References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 26, 2002
Grant dateMay 17, 2005
Priority date
Expiry dateJun 5, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/38
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for constructing a photomask assembly using an encoded mark is disclosed. The method includes comparing a first encoded mark located on a photomask with a second encoded mark located on a pellicle. The first encoded mark includes one or more first symbols and the second encoded mark includes one or more second symbols. The method further includes mounting the pellicle on the photomask if at least one of the symbols of the first encoded mark matches at least one of the symbols of the second encoded mark.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.