System and method for inspecting the structural integrity of visibly clear objects
US6894775B1 · kind B1 · utility
8Cited by
16References
34Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 27, 2000 |
| Grant date | May 17, 2005 |
| Priority date | — |
| Expiry date | Apr 27, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/90
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system is provided comprising at least one detection element (60) sensitive to electromagnetic radiation (20) at a wavelength wherein the object (10) to be inspected is rendered opaque by naturally occurring material molecular absorptions. As such, material defects such as cracks and voids can be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.