X-ray measuring apparatus
US6895080B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2001 |
| Grant date | May 17, 2005 |
| Priority date | — |
| Expiry date | Oct 29, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides an x-ray measuring apparatus for diagnosis having high spatial resolution and high sensitivity, which includes: an x-ray source for emitting x-rays from an x-ray focal spot; an x-ray detector in which a plurality of sensing elements each having a sensitive part and a blind part surrounding the sensitive part are arranged two-dimensionally; data processing means for collecting output signals of the sensing elements and performing data processing; and an anti-scatter grid disposed between the x-ray focal spot and the x-ray detector with predetermined distance from the position of the x-ray focal spot and in which an x-ray transmitting member and an x-ray shielding member are alternately arranged in a first direction. A pitch in the first direction of linear images projected on a sensing surface of the x-ray detector of the x-ray shielding member by the x-ray is set to be substantially an integral multiple of two or larger of the pitch of arrangement of the sensing elements in the first direction. In such a manner, a moiré-free image of a wide field of view is obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.