Patent · US Expired

Phase locked loop with low steady state phase errors and calibration circuit for the same

US6897691B2 · kind B2 · utility

6Cited by
4References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 15, 2003
Grant dateMay 24, 2005
Priority date
Expiry dateMay 15, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/18
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A phase locked loop (PLL) with low steady state phase errors utilizes a delay unit to delay an input signal or a reference clock so as to lower the steady state phase errors of the PLL. A calibration circuit is used to adjust the delay time of the delay unit and includes a signal generator for generating a simulation input signal and a simulation reference clock according to a phase locked clock; a delay unit for delaying the simulation reference clock and generating a delayed reference clock; a phase detector for detecting the phase error between the simulation input signal and the delayed reference clock and generating charge control signals; a charge pump and an integrator for generating an error voltage according to the charge control signals; a delay time control unit for adjusting the delay time of the delay unit according to the error voltage; and a voltage control oscillator for generating the oscillation clock according to a reference control voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.