Patent · US Expired

Method and apparatus for calibration of light-modulating array

US6898377B1 · kind B1 · utility

4Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 26, 2002
Grant dateMay 24, 2005
Priority date
Expiry dateJul 8, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04J14/005
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

One embodiment disclosed relates to a method for calibrating an array of light-modulating elements. The method includes illuminating the array of elements, modulating an intensity of light diffracted by the elements over a modulation range, and measuring the modulated light intensity from each element of the array using a linear detector. Other embodiments disclosed relate to an apparatus and system for calibrating an array of light-modulating elements. The apparatus includes a light source for illuminating the array of elements and a linear detector for measuring light intensities at points along a line segment. The apparatus is configured so that modulated light from each of the elements impinges upon a different point of the line segment. The system includes means for modulating an intensity of light diffracted by the elements over a modulation range and a detector for measuring the modulated light intensity from each element of the array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.