Patent · US Expired

Method of and apparatus for testing a serial differential/mixed signal device

US6898746B2 · kind B2 · utility

4Cited by
9References
42Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 2001
Grant dateMay 24, 2005
Priority date
Expiry dateAug 13, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3167
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Testing of a mixed signal electronic device, and evaluating of a test environment. A test driver applies an input test signal to the device. The response of the device is monitored on a differential monitoring device to obtain analog data and on a tester receiver to obtain digital data. The analog data and the digital data are processed, the processed data are compared and evaluated, and the device is evaluted. A virtual test environment is created emulating an actual test environment, and a virtual device emulating the actual device is created and is stimulated with an input test signal emulating an actual input signal. The response of the virtual device is monitored to obtain analog data and digital data. The analog data and the digital data are processed, the processed analog and digital data are compared and evaluated, and the virtual device is evaluated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.