Patent · US Expired

Deconvolving far-field images using scanned probe data

US6900435B1 · kind B1 · utility

4Cited by
3References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 14, 2000
Grant dateMay 31, 2005
Priority date—
Expiry dateFeb 14, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B21/002
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for deconvolving far-field optical images beyond the diffraction limit includes the use of near-field optical and other scanned probe imaging data to provide powerful and new constraints for the deconvolution of far-field data sets. Near-field data, such as that which can be obtained from atomic force microscopy on a region of the far-field data set in an integrated and inter-digitate way, is used to produce resolutions beyond the diffraction limit of the lens that is being used. In the case of non-linear optical imaging or other microscopies, resolutions beyond that which is achievable with these microscopies can be obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.