Patent · US Expired

Method and device for measuring thermoelectric characteristics of combinatorial specimen

US6902317B2 · kind B2 · utility

1Cited by
7References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 14, 2002
Grant dateJun 7, 2005
Priority date
Expiry dateMar 14, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and device for measuring thermoelectric characteristics of a combinatorial sample. The method and device are useful for rapid sample evaluation, the investigation of thermoelectric materials, and the carrier control of semiconductors. The device includes combinatorial samples patterned with a metal mask, a pair of sample holders for applying a small temperature gradient to the sample, a thermocouple for measuring the temperature gradient, and a probe pin array in contact with the sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.