Patent · US Expired

Multi-point subsurface measurement calibration

US6903330B2 · kind B2 · utility

4Cited by
16References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 1, 2002
Grant dateJun 7, 2005
Priority date
Expiry dateMay 2, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V13/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Techniques for calibrating well-logging sensors comprising emitting a first signal into a first calibration substance disposed proximate to the sensor, measuring a first sensor response from the first signal, emitting a second signal into a second calibration substance disposed proximate to the sensor, measuring a second sensor response from the second signal, and determining a sensor response function from the first sensor response and the second sensor response. One embodiment includes providing a well-logging sensor having a known response function, determining an expected range of a quality check response of the sensor using a quality-check substance with known properties, emitting a quality check signal into the quality-check substance, measuring the quality check response from the quality check signal, and comparing the expected range with the quality check response.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.