Device aging determination circuit
US6903564B1 · kind B1 · utility
76Cited by
6References
48Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 12, 2003 |
| Grant date | Jun 7, 2005 |
| Priority date | — |
| Expiry date | Nov 12, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device aging determination circuit. Circuits are located on a device, including a first circuit operating at a first duty cycle and generating a first output and a second circuit operating at a second duty cycle different from said first duty cycle and generating a second output. A measuring circuit determines a difference in the first output and the second output, wherein the difference indicates an aging of the device. The aging is a representation of how much degradation the device has been exposed to, and allows for dynamic adjustment of operating parameters of the device to optimize performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.