Method and apparatus for improving the reliability of the reading of integrated circuit fuses
US6903986B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 3, 2002 |
| Grant date | Jun 7, 2005 |
| Priority date | — |
| Expiry date | Jul 3, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/74
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system is provided for use with an on-chip fuse. If the fuse (40) is to be blown, the system blows the fuse, then performs a test read by comparing it with a larger-than-normal reference resistance (41, 42). If, even using the larger-than-normal reference resistance, the fuse reads as blown, then it is possible to be much more confident that the fuse will read correctly when compared against the normal reference resistance (42), even with aging and with variations of temperature and supply. For future reads during normal operation, the system compares it with the normal reference resistance (42). If, on the other hand, the fuse does not read as blown during the test read then the device can be rejected as a failed device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.