Patent · US Expired

Memory cell with fuse element

US6903993B2 · kind B2 · utility

4Cited by
1References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 22, 2004
Grant dateJun 7, 2005
Priority date
Expiry dateJan 22, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a programmable memory device and a method of setting a state for a programmable memory device. In at least one embodiment, the memory device comprises at least a level shifter adapted to stand off a high programing voltage to at least one fuse element in the memory device, wherein the high programming voltage is used to set a state of the memory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.