Patent · US Expired

Apparatus and method for analyzing samples in a dual ion trap mass spectrometer

US6906324B1 · kind B1 · utility

16Cited by
1References
45Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 26, 2003
Grant dateJun 14, 2005
Priority date
Expiry dateDec 12, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/004
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.