Methods and apparatus for measuring a surface contour of an object
US6906808B2 · kind B2 · utility
6Cited by
28References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 30, 2002 |
| Grant date | Jun 14, 2005 |
| Priority date | — |
| Expiry date | Jul 23, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method enables a surface contour of an object to be measured using an optical system. The method includes positioning the object in a measurement cell, filling the cell with fluid, transmitting light towards the object in the measurement cell, measuring the illumination of a surface of the object, generating an image of the object based on the illumination of the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.