Patent · US Expired

Flash memory with protruded floating gate

US6909140B2 · kind B2 · utility

1Cited by
3References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 12, 2004
Grant dateJun 21, 2005
Priority date
Expiry dateJul 12, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035

Abstract

A method of forming a flash memory with a protruded floating gate. A substrate is provided. An isolation area and a plurality of patterned conductive layers are sequentially formed on the substrate. The isolation area protrudes from the upper surface of the substrate to isolate the patterned conductive layers. A photo resist layer is formed on the patterned conductive layer. The present invention also provides a flash memory with a protruded floating gate comprised a substrate, a plurality of protruded floating gates, an insulator, and a control gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.