Patent · US Expired

Low voltage silicon controlled rectifier (SCR) for electrostatic discharge (ESD) protection of silicon-on-insulator technologies

US6909149B2 · kind B2 · utility

84Cited by
9References
31Claims
0Family size

Assignees

Inventors

Key dates

Filing dateApr 15, 2004
Grant dateJun 21, 2005
Priority date
Expiry dateApr 15, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D18/251

Abstract

A silicon-on-insulator (SOI) electrostatic discharge (ESD) protection device that can protect very sensitive thin gate oxides by limiting the power dissipation during the ESD event, which is best achieved by reducing the voltage drop across the active (protection) device during an ESD event. In one embodiment, the invention provides very low triggering and holding voltages. Furthermore, the SOI protection device of the present invention has low impedance and low power dissipation characteristics that reduce voltage build-up, and accordingly, enable designers to fabricate more area efficient protection device

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.