Methods for identification and verification using vacuum XRF system

US6909770B2 · kind B2 · utility

Assignees

• The United States of America as represented by the United States National Aeronautics and Space Administration · US
• KeyMasters Technologies, Inc. · US

Inventors

• Fred Schramm · Winchester, US
• Bruce Kaiser · Wilmington, US

Key dates

• Filing date: Nov 29, 2002
• Grant date: Jun 21, 2005
• Expiry date: Jan 7, 2023

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/076
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Apparatus and methods in which one or more elemental taggants that are intrinsically located in an object are detected by x-ray fluorescence analysis under vacuum conditions to identify or verify the object's elemental content for elements with lower atomic numbers. By using x-ray fluorescence analysis, the apparatus and methods of the invention are simple and easy to use, as well as provide detection by a non line-of-sight method to establish the origin of objects, as well as their point of manufacture, authenticity, verification, security, and the presence of impurities. The invention is extremely advantageous because it provides the capability to measure lower atomic number elements in the field with a portable instrument.