Patent · US Expired

Data management system and method for processing signals from sample spots

US6909981B2 · kind B2 · utility

9Cited by
3References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 8, 2004
Grant dateJun 21, 2005
Priority date
Expiry dateJan 8, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG16B50/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

One embodiment of the invention is directed to a method of processing a plurality of spectra. The method includes receiving values associated with a plurality of sample spots on one or more sample chips, wherein the values were entered using graphic elements representing the sample spots, the graphic elements being displayed on a graphical user interface. Data representing a plurality of signals are received. Each signal in the plurality of signals is annotated with a set of values associated with the sample spot from which the signal is generated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.