Measurements of electromagnetic properties and interactions based on radiation-excited polarizations
US6911646B1 · kind B1 · utility
22Cited by
4References
36Claims
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Key dates
| Filing date | May 22, 2000 |
| Grant date | Jun 28, 2005 |
| Priority date | — |
| Expiry date | May 22, 2020 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y35/00
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
Techniques and systems using polarizable objects in sufficiently close proximity to measure the force of interaction between a sample and a probe to obtain information about the properties of the sample. One or more small mechanical oscillators with high force sensitivity are engaged to the sample or the probe for the measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.