Scanning microscope
US6914236B2 · kind B2 · utility
6Cited by
3References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 17, 2001 |
| Grant date | Jul 5, 2005 |
| Priority date | — |
| Expiry date | Dec 7, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The scanning microscope comprises an illumination beam path (41), microscope optics (37) and at least one light source (17, 21, 61, 67), which generates an excitation light beam (19, 63) of a first wavelength and an emission light beam (23, 69) of a second wavelength. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path (41) are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.