Inspecting apparatus for foreign matter and inspecting mechanism thereof
US6914672B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 19, 2002 |
| Grant date | Jul 5, 2005 |
| Priority date | — |
| Expiry date | Jun 21, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/9081
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A turn controllable inspection table which have a step between a portion where mount sections on which respective objects being inspected are mounted are formed along a circumference and an inside portion thereof, so that light from a light source illuminating a side face portion of each object being inspected is allowed to be incident on at least a side face region including a bottom portion of a side face of each object being inspected in a direction perpendicular to the side face region is provided. Further, clamps for fixing the respective objects being inspected onto the mount sections by pressing a head portion of each object being inspected with a top board made of a transparent member, so that inspection is possible across an entire region from all directions including directions from above and sideways of each object being inspected are provided. Consequently, it is possible to provide an inspecting apparatus for a foreign matter capable of eliminating a blind spot in an illuminated region and a pictured region of an object being inspected, and capable of detecting the presence or absence of a suspended foreign matter inside a container as a an object being inspected at a …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.