Test tool and methods for testing a system-managed duplexed structure
US6915455B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 15, 2002 |
| Grant date | Jul 5, 2005 |
| Priority date | — |
| Expiry date | Sep 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Test tool logic and testing methods are provided for facilitating testing a duplexed computer function, such as a duplexed coupling facility. The test tool allows a testcase written for a first environment to be automatically driven in a second environment, thereby facilitating testing of a function of the second environment. Other aspects include logic for intercepting a system event by a test tool to facilitate testing of system-managed event processing, and for adjusting a display characteristic of one or more messages to be displayed by the test tool based on message type. Further, logic for propagating an environmental error indication and for facilitating processing a wait state are also provided, as are several new test tool verbs and macros.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.