Patent · US Expired

System and device for characterizing shape memory alloy wires

US6916115B1 · kind B1 · utility

12Cited by
17References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 4, 2004
Grant dateJul 12, 2005
Priority date
Expiry dateMar 4, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0224
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Instruments and methods for measuring a property of a shape memory alloy are provided. The instrument includes a base plate, a non-contact movable mass, a force gauge, an actuator, a biasing spring, a heater for heating the shape memory alloy, and a non-contact displacement detector. The biasing spring and the shape memory alloy are disposed whereby a force applied thereby is applied substantially through a center of stiffness of the movable mass. The displacement detector measures a displacement of the movable mass in a colinear direction with a direction of movement of the movable mass and with a direction of the force applied by the biasing spring and the shape memory alloy. The linear motion stage comprises a housing and at least one guide bar, and wherein a calculated axial expansion of the guide bar is substantially equal to a calculated axial expansion of the base plate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.