Method and device for use in DC parametric tests
US6917320B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2004 |
| Grant date | Jul 12, 2005 |
| Priority date | — |
| Expiry date | Apr 28, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and device suitable for use in performing a DC parametric test on an external load is provided. The device may be configured to apply a desired voltage or current to the external load. The circuit device receives a forcing parameter signal at an input and releases at an output a signal approximating the forcing parameter signal to the external load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and an internal load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point. The application of second voltage signal to the intermediate voltage point causes a change in either one of the voltage signal or the current signal at the output such that a signal approximating the forcing parameter signal is caused at the output. A cu…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.