System and method for scanning a region using a low discrepancy curve
US6917710B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2001 |
| Grant date | Jul 12, 2005 |
| Priority date | — |
| Expiry date | May 17, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/421
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A scanning system and method for scanning for an object within a region, or for locating a point within a region. Embodiments of the invention include a method for scanning for an object within a region using a Low Discrepancy Curve (LDC) scanning scheme. The method may: 1) generate a Low Discrepancy Sequence (LDS) of points in the region; 2) calculate an LDC in the region based on the LDS of points; and 3) scan the region along the LDC to determine one or more characteristics of the object in response to the scan. In calculating the LDC in the region based on the LDS of points, the method may connect sequential pairs of the LDS with contiguous orthogonal line segments (each parallel to a respective axis of the region), then sample the segments, generating points which may be used to generate the LDC, such as by a curve fit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.