Reference mark, method for recognizing reference marks and method for object measuring
US6917720B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 4, 1997 |
| Grant date | Jul 12, 2005 |
| Priority date | — |
| Expiry date | Jul 4, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/245
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a reference mark, a method for recognizing reference marks and a method for object measuring. According to the invention, the object is fitted with coded reference marks. Said marks are automatically recognized and decoded by the inventive method for reference mark recognition, whereupon a three-dimensional representation of the object is realized. According to the invention, the method compensates automatically for geometrical and radiometric interferences and generates at least one quality measurement to evaluate the quality of recognition and decoding. The invention particularly enables fast recognition and decoding of large numbers of reference marks and fast measuring of objects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.