Method and apparatus for visually time-correlating waveform measurements to a source waveform
US6917889B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2003 |
| Grant date | Jul 12, 2005 |
| Priority date | — |
| Expiry date | Feb 26, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/0245
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test and measurement instrument acquires a signal from a device under test, displays that signal as a source waveform, and makes measurements on that source waveform with regard to a predetermined property or event. The test and measurement instrument employs the method of the subject invention for placing these measurements into a waveform and directly correlating a position in the measurement waveform to the same area on the source waveform where they were measured. Specifically, the subject invention displays the correlation of points on a source waveform and a measurement waveform without requiring the use of a common horizontal time scale. In one embodiment of the invention, the measurement waveform is a histogram and a pointer to a given location in the histogram causes identification of corresponding areas in the source waveform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.