Patent · US Expired

Differential self-test of input/output circuits

US6918073B2 · kind B2 · utility

8Cited by
1References
39Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 2002
Grant dateJul 12, 2005
Priority date
Expiry dateJul 23, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31715
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An electronic circuit for enabling differential tests. In representative embodiments, the electronic circuit includes a first differential receiver having first and second inputs and an output, a first switch having first and second data inputs, a control input, and an output, and a first control device having an output. The first input of the first differential receiver is connected to a first contact and to a first single ended receiver input, and the second input of the first differential receiver is connected to a second contact and to a second single ended receiver input. The first data input of first switch is connected to first single ended receiver output, and the second data input of first switch is connected to first differential receiver output. The first control device output is connected to first switch control input. When first control device output is in a specified condition, first data input of first switch is connected to first switch output, otherwise second data input of first switch is connected to first switch output.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.