Method and system for creating test component layouts
US6920620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 31, 2002 |
| Grant date | Jul 19, 2005 |
| Priority date | — |
| Expiry date | Dec 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/398
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a computer-implemented method and system for creating a test component layout, after creating a reference component layout that is composed of a set of polygonal working shapes, a plurality of shape parameters are defined for the working shapes of the reference component layout, and a parameter template is formed based on the shape parameters of the reference component layout. Thereafter, user-defined distance values corresponding to the shape parameters may be inputted into the parameter template, and the test component layout is automatically created by adjusting geometry of the working shapes of the reference component layout with reference to the user-defined distance values inputted into the parameter template.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.