Method, system and computer product for plaque characterization
US6922462B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2002 |
| Grant date | Jul 26, 2005 |
| Priority date | — |
| Expiry date | Oct 1, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30048
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for plaque characterization. The method comprises obtaining a first set of image data created in response to a first x-ray energy level and including a plurality of pixel elements. Each of the first pixel elements corresponds to a unique location in an object being scanned. The method further comprises obtaining a second set of image data created in response to a second x-ray energy level and including a plurality of second pixel elements. Each of the second pixel elements corresponds to one of the first pixel elements and the second x-ray energy level is higher than the first x-ray energy level. The method also comprises calculating a third set of image data in response to the first set of image data and the second set of image data. The calculating includes subtracting each second pixel element from the corresponding first pixel element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.