MULTI-CHANNEL ANALOG TO DIGITAL CONVERTER WHICH FACILITATES CALIBRATION OF THE ANALOG TO DIGITAL CONVERTER AND RESPECTIVE INPUT CHANNELS TO THE ANALOG TO DIGITAL CONVERTER, AND A METHOD FOR CALIBRATING THE ANALOG TO DIGITAL CONVERTER
US6924755B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2002 |
| Grant date | Aug 2, 2005 |
| Priority date | — |
| Expiry date | Dec 2, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1225
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A multi-channel analog to digital converter which facilitates calibration of the analog to digital converter and respective input channels to the analog to digital converter, and a method for calibrating the analog to digital converter. A multi-channel ADC (1) comprising an ADC circuit (2) for converting analog signals received on input channels CH1 to CHN to digital output signals comprises a primary offset storing register (24) and a primary gain storing register (25) for storing respective primary offset and gain correction codes which are applied to the digital output signals in a primary correcting circuit (14) for correcting for the offset and gain errors introduced by the ADC circuit (2). A plurality of secondary offset storing registers (33) and a plurality of secondary gain storing registers (34) store respective secondary offset and gain correction codes which are applied to the digital output signals in a secondary correcting circuit (18) for correcting for offset and gain errors introduced by corresponding ones of the input channels CH1 to CHN.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.