Adaptive test program generation
US6925405B2 · kind B2 · utility
13Cited by
5References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 9, 2002 |
| Grant date | Aug 2, 2005 |
| Priority date | — |
| Expiry date | Dec 31, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test program generator that produces test instructions according to a specification of a system being verified. The instructions are typically generated randomly, at least in part, and are then. The system is capable of interpreting events, detecting an impending occurrence of an event, and responding to the event by switching to an alternate input stream.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.