Apparatus and method of measuring features of an article
US6925414B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2003 |
| Grant date | Aug 2, 2005 |
| Priority date | — |
| Expiry date | Aug 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method of measuring an article is provided. The method includes providing an article having a feature to be measured, the article having a surface; measuring the surface of the article with a measuring instrument to obtain article surface data; and analyzing the article surface feature data such that data on the feature to be measured is developed. Measuring the surface of the article can include scanning the measuring instrument over the article surface. Analyzing the article surface feature data can include associating portions of the article surface data with individual features thereby producing associated feature surface data; and analyzing the associated feature surface data. The measuring instrument can be, for example, a contact measuring instrument or an interference measuring instrument. A computer storage medium having instructions stored therein for causing a computer to perform the method described above is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.