Methods and apparatus for testing data lines
US6925588B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2002 |
| Grant date | Aug 2, 2005 |
| Priority date | — |
| Expiry date | Jan 27, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for testing data lines to determine signal degradation in the data lines. A system includes a signal generator for generating a test pattern and for transferring the test pattern through the data lines. The system also includes an analyzer communicatively connected to the data lines to determine degradation of the test pattern in the data lines. The signal generator generates and transfers a first test pattern through the data lines. The first test pattern includes a first portion having a first polarity and a second portion having a second polarity. The signal generator then generates and transfers a second test pattern through the data lines in response to transferring the first test pattern. The test patterns may be repeated one or more times to determine cross talk caused by inductive coupling between data lines and additive reflections.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.