Patent · US Expired

Method to test power distribution system

US6925616B2 · kind B2 · utility

5Cited by
18References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 4, 2002
Grant dateAug 2, 2005
Priority date
Expiry dateAug 30, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31721
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for testing a core power distribution system for an integrated circuit chip which includes arranging a plurality of experiments for an integrated circuit chip, performing the plurality of experiments for the integrated circuit chip over a range of frequencies over a range of power distribution system impedances, generating a schmoo diagram for each of the plurality of experiments, and analyzing the schmoo diagrams to determine whether the core power distribution system functions is acceptable at a particular frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.